Atomic Force Microscope (AFM)
Atomic force microscopes (AFM) scan a probe over a sample to measure forces at nanoscale resolution, producing 3D topographic images. Classified in HTS 9012.10.00.00 as it operates without optical magnification, using mechanical force detection. Used in semiconductors and biotech.
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Alternative Classifications
This product could be classified differently depending on its characteristics or intended use.
If cantilever arrays or probe holders
Probes and mechanical parts exclusive to AFMs go to 9022.
If optical lever predominates
Optical components may pull classification toward 9013 microscopes.
If profile projectors with force measurement
Measuring instruments with other technologies classify in 9031.
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Import Tips & Compliance
• Document cantilever specifications and scanning modes (contact/tapping) for classification
• Ensure laser safety compliance for optical lever detection systems
Related Products under HTS 9012.10.00.00
X-Ray Diffraction Apparatus
X-ray diffraction apparatus directs X-rays at crystalline samples to analyze atomic and molecular structure through diffraction patterns. It qualifies for HTS 9012.10.00.00 as diffraction apparatus, distinct from optical microscopes. Widely used in materials science for phase identification and crystallography.
Field Emission Microscope
Field emission microscopes utilize field-emitted electrons to image surfaces at high resolution under ultra-high vacuum. Fits HTS 9012.10.00.00 as electron-based non-optical microscope. Used for catalysis and surface physics studies.
Powder X-Ray Diffractometer
Powder X-ray diffractometers analyze polycrystalline samples by measuring diffraction angles from rotating samples. Classified HTS 9012.10.00.00 as dedicated diffraction apparatus. Standard in pharmaceutical R&D for phase identification.
Near-Field Scanning Optical Microscope (NSOM)
NSOMs achieve resolution beyond diffraction limit using sub-wavelength apertures despite optical detection. Still HTS 9012.10.00.00 as specialized non-standard optical microscope. For plasmonics and nanophotonics.
Helium Ion Microscope
Helium ion microscopes use He+ ions for sub-nanometer surface imaging with minimal sample damage. HTS 9012.10.00.00 as charged particle non-optical microscope. Superior for insulators and beam-sensitive materials.
Scanning Electron Microscope (SEM)
A scanning electron microscope (SEM) uses a focused beam of electrons to produce high-resolution images of a sample's surface topography and composition. It falls under HTS 9012.10.00.00 as it is a microscope other than an optical microscope, relying on electron microscopy rather than light optics. Commonly used in materials science and biology for detailed surface analysis.