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9012.10.00.00/Atomic Force Microscope (AFM)/Canada

Atomic Force Microscope (AFM) from Canada

Atomic force microscopes (AFM) scan a probe over a sample to measure forces at nanoscale resolution, producing 3D topographic images. Classified in HTS 9012.10.00.00 as it operates without optical magnification, using mechanical force detection. Used in semiconductors and biotech.

Duty Rate — Canada → United States

10%

Rate breakdown

9903.05.2910%Section 301 (forced labor) — additional 10% ad valorem on products of Canada
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Import Tips

• Document cantilever specifications and scanning modes (contact/tapping) for classification

• Ensure laser safety compliance for optical lever detection systems