Microscopes other than optical microscopes; diffraction apparatus
Microscopes other than optical microscopes; diffraction apparatus; parts and accessories thereof: > Microscopes other than optical microscopes; diffraction apparatus
Duty Rate (from China)
Except for products described in headings 9903.03.02–9903.03.11, articles the product of any country, as provided for in subdivision (aa) of U.S. note 2 to this subchapter
Except as provided in headings 9903.88.05, 9903.88.06, 9903.88.07, 9903.88.08, 9903.88.10, 9903.88.11, 9903.88.14, 9903.88.19, 9903.88.50, 9903.88.52, 9903.88.58, 9903.88.60, 9903.88.62, 9903.88.66, 9903.88.67, 9903.88.68, or 9903.88.69, articles the product of China, as provided for in U.S. note 20(a) to this subchapter and as provided for in the subheadings enumerated in U.S. note 20(b) [to this subchapter]
Products classified under HTS 9012.10.00.00
X-Ray Diffraction Apparatus
X-ray diffraction apparatus directs X-rays at crystalline samples to analyze atomic and molecular structure through diffraction patterns. It qualifies for HTS 9012.10.00.00 as diffraction apparatus, distinct from optical microscopes. Widely used in materials science for phase identification and crystallography.
Field Emission Microscope
Field emission microscopes utilize field-emitted electrons to image surfaces at high resolution under ultra-high vacuum. Fits HTS 9012.10.00.00 as electron-based non-optical microscope. Used for catalysis and surface physics studies.
Powder X-Ray Diffractometer
Powder X-ray diffractometers analyze polycrystalline samples by measuring diffraction angles from rotating samples. Classified HTS 9012.10.00.00 as dedicated diffraction apparatus. Standard in pharmaceutical R&D for phase identification.
Near-Field Scanning Optical Microscope (NSOM)
NSOMs achieve resolution beyond diffraction limit using sub-wavelength apertures despite optical detection. Still HTS 9012.10.00.00 as specialized non-standard optical microscope. For plasmonics and nanophotonics.
Helium Ion Microscope
Helium ion microscopes use He+ ions for sub-nanometer surface imaging with minimal sample damage. HTS 9012.10.00.00 as charged particle non-optical microscope. Superior for insulators and beam-sensitive materials.
Scanning Electron Microscope (SEM)
A scanning electron microscope (SEM) uses a focused beam of electrons to produce high-resolution images of a sample's surface topography and composition. It falls under HTS 9012.10.00.00 as it is a microscope other than an optical microscope, relying on electron microscopy rather than light optics. Commonly used in materials science and biology for detailed surface analysis.
Transmission Electron Microscope (TEM)
Transmission electron microscopes (TEM) transmit a beam of electrons through an ultra-thin specimen to form images at atomic resolution. Classified under HTS 9012.10.00.00 as a non-optical microscope using electron transmission for imaging. Ideal for studying internal structures in nanotechnology and life sciences.
Scanning Tunneling Microscope (STM)
Scanning tunneling microscopes (STM) measure quantum tunneling currents between a sharp probe and sample surface for atomic-scale imaging. Falls under HTS 9012.10.00.00 as a non-optical microscope using electron tunneling. Essential for surface science and nanotechnology research.
Atomic Force Microscope (AFM)
Atomic force microscopes (AFM) scan a probe over a sample to measure forces at nanoscale resolution, producing 3D topographic images. Classified in HTS 9012.10.00.00 as it operates without optical magnification, using mechanical force detection. Used in semiconductors and biotech.
Neutron Diffraction Instrument
Neutron diffraction instruments use neutron beams to probe magnetic structures and large-scale atomic arrangements in materials. HTS 9012.10.00.00 covers it as diffraction apparatus beyond optical methods. Applied in physics research at neutron facilities.
Electron Probe Microanalyzer (EPMA)
Electron probe microanalyzers (EPMA) combine electron microscopy with X-ray spectrometry for elemental analysis at microscale. Under HTS 9012.10.00.00 for its primary electron microscope function. Key for geochemistry and metallurgy.