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9012.10.00.00/Atomic Force Microscope (AFM)/Germany

Atomic Force Microscope (AFM) from Germany

Atomic force microscopes (AFM) scan a probe over a sample to measure forces at nanoscale resolution, producing 3D topographic images. Classified in HTS 9012.10.00.00 as it operates without optical magnification, using mechanical force detection. Used in semiconductors and biotech.

Duty Rate — Germany → United States

10%

Rate breakdown

9903.05.3910%Section 301 (forced labor) — European Union member state (col1 rate < 10 percent): MFN < 10% → total duty capped at 10%
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Import Tips

• Document cantilever specifications and scanning modes (contact/tapping) for classification

• Ensure laser safety compliance for optical lever detection systems

Atomic Force Microscope (AFM) from Germany — Import Duty Rate | HTS 9012.10.00.00