9012.10.00.00/Atomic Force Microscope (AFM)/Mexico

Atomic Force Microscope (AFM) from Mexico

Atomic force microscopes (AFM) scan a probe over a sample to measure forces at nanoscale resolution, producing 3D topographic images. Classified in HTS 9012.10.00.00 as it operates without optical magnification, using mechanical force detection. Used in semiconductors and biotech.

Duty Rate — Mexico → United States

10%

Rate breakdown

9903.03.0110%Except for products described in headings 9903.03.02–9903.03.11, articles the product of any country, as provided for in subdivision (aa) of U.S. note 2 to this subchapter
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Import Tips

• Document cantilever specifications and scanning modes (contact/tapping) for classification

• Ensure laser safety compliance for optical lever detection systems

Atomic Force Microscope (AFM) from Mexico — Import Duty Rate | HTS 9012.10.00.00