9012.10.00.00/Atomic Force Microscope (AFM)/Japan

Atomic Force Microscope (AFM) from Japan

Atomic force microscopes (AFM) scan a probe over a sample to measure forces at nanoscale resolution, producing 3D topographic images. Classified in HTS 9012.10.00.00 as it operates without optical magnification, using mechanical force detection. Used in semiconductors and biotech.

Duty Rate — Japan → United States

12.5%

Rate breakdown

9903.05.4912.5%Section 301 (forced labor) — Japan (col1 rate < 12.5 percent): MFN < 12.5% → total duty capped at 12.5%

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Import Tips

• Document cantilever specifications and scanning modes (contact/tapping) for classification

• Ensure laser safety compliance for optical lever detection systems