Atomic Force Microscope (AFM) from Japan
Atomic force microscopes (AFM) scan a probe over a sample to measure forces at nanoscale resolution, producing 3D topographic images. Classified in HTS 9012.10.00.00 as it operates without optical magnification, using mechanical force detection. Used in semiconductors and biotech.
Duty Rate — Japan → United States
12.5%
Rate breakdown
9903.05.4912.5%Except for products described in headings 9903.05.85–9903.05.92, articles the product of Japan, with an ad valorem (or ad valorem equivalent) rate of duty under column 1 less than 12.5 percent, as provided for in U.S. note 52 to this subchapter
Import Tips
• Document cantilever specifications and scanning modes (contact/tapping) for classification
• Ensure laser safety compliance for optical lever detection systems