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Wafer Flatness Metrology Tool

Precision interferometer system measuring wafer bow, warp, and total thickness variation critical for fabrication readiness. HTS 8445.90.00.00 under wafer grinder/lapper/polisher notes.

Import Duty Rates by Country of Origin

Origin CountryMFN RateCh.99 SurchargesTotal Effective Rate
šŸ‡ØšŸ‡³China3.7%+20.0%23.7%
šŸ‡²šŸ‡½Mexico3.7%+10.0%13.7%
šŸ‡ØšŸ‡¦Canada3.7%+10.0%13.7%
šŸ‡©šŸ‡ŖGermanyFree+10.0%10%
šŸ‡ÆšŸ‡µJapanFree+12.5%12.5%

Alternative Classifications

This product could be classified differently depending on its characteristics or intended use.

9031.41.00Higher: 25% vs 23.7%

If standalone precision measuring instruments

Measuring/ checking instruments separate from production machines.

9013.80Lower: 17% vs 23.7%

If laser interferometers for general use

Laser apparatus classification.

9027.50.40Higher: 37.5% vs 23.7%

If physical properties analyzers

Instruments for physical/ chemical analysis.

Not sure which classification is right?

The Tariff Assistant works through the GRI rules on your specific product to reach the right HTS code — and can price the duty on it in the same conversation.

Import Tips & Compliance

• Resolution specs (e.g

• 0.1μm flatness) required

• Avoid Chapter 90 if integral to grinding process control

• Document feedback loop to lapping equipment