Wafer Flatness Metrology Tool

Precision interferometer system measuring wafer bow, warp, and total thickness variation critical for fabrication readiness. HTS 8445.90.00.00 under wafer grinder/lapper/polisher notes.

Import Duty Rates by Country of Origin

Origin CountryMFN RateCh.99 SurchargesTotal Effective Rate
🇨🇳China3.7%+17.5%21.2%
🇲🇽Mexico3.7%+10.0%13.7%
🇨🇦Canada3.7%+10.0%13.7%
🇩🇪Germany3.7%+10.0%13.7%
🇯🇵Japan3.7%+10.0%13.7%

Alternative Classifications

This product could be classified differently depending on its characteristics or intended use.

9031.41.00Higher: 35% vs 21.2%

If standalone precision measuring instruments

Measuring/ checking instruments separate from production machines.

9013.80Lower: 14.5% vs 21.2%

If laser interferometers for general use

Laser apparatus classification.

9027.50.40Higher: 35% vs 21.2%

If physical properties analyzers

Instruments for physical/ chemical analysis.

Not sure which classification is right?

Our AI classifier can analyze your specific product and recommend the correct HTS code with confidence.

Import Tips & Compliance

Resolution specs (e.g

0.1μm flatness) required

Avoid Chapter 90 if integral to grinding process control

Document feedback loop to lapping equipment