Other instruments, appliances and machines
Instruments and apparatus for physical or chemical analysis (for example, polarimeters, refractometers, spectrometers, gas or smoke analysis apparatus); instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like; instruments and apparatus for measuring or checking quantities of heat, sound or light (including exposure meters); microtomes. > Other optical instruments and appliances: > Other > Other instruments, appliances and machines
Duty Rate (from China)
Products classified under Tariff item 9031.80
Anemometer Vane Type
The rotating vane anemometer measures air velocity in ducts and HVAC systems, functioning as a mechanical airflow measuring instrument. It falls under tariff item 9031.80.00 as an 'other instrument' for measuring or checking physical properties, not covered by more specific headings.
9031.80.00Applied Materials VeritySEM 10 Electron Beam Microscope
The Applied Materials VeritySEM 10 is an electron beam microscope designed for semiconductor metrology, featuring automated wafer cassette loaders and vacuum-compatible reticle stages. It falls under tariff item 9031.80.00 as an 'other instrument' for measuring or checking physical characteristics, specifically tailored for semiconductor inspection.
9031.80.00Camtek Eagle i 3D Electron Beam Metrology System
The Camtek Eagle i 3D Electron Beam Metrology System provides 3D metrology with automated wafer mapping and handling for advanced packaging inspection. It is classified under tariff item 9031.80.00 as an 'other instrument' for measuring or checking semiconductor structures, distinct from optical inspection devices.
9031.80.00Coating Thickness Gauge
The coating thickness gauge uses magnetic or eddy current principles to measure paint or plating thickness on metal substrates. It is classified under tariff item 9031.80.00 as an 'other instrument' for measuring or checking non-optical properties, distinct from length or volume measuring devices.
9031.80.00Dial Bore Gauge
The dial bore gauge is an adjustable gauge set for precise internal diameter measurement in engine cylinders and holes. It falls under tariff item 9031.80.00 as an 'other instrument' for measuring or checking dimensions, not covered by other specific headings in Chapter 90.
9031.80.00Digital Micrometer
The digital micrometer is a precision handheld tool used to measure small distances with high accuracy in manufacturing quality control. It is classified under tariff item 9031.80.00 as an 'other instrument' for measuring or checking dimensions, not specified elsewhere in Chapter 90.
9031.80.00Force Gauge Digital
The digital force gauge measures push/pull forces in tension and compression testing, functioning as a handheld measuring instrument. It falls under tariff item 9031.80.00 as an 'other instrument' for measuring or checking mechanical properties, not covered by more specific headings.
9031.80.00Hardness Tester Portable
The portable hardness tester uses rebound or ultrasonic methods for non-destructive material hardness testing on-site. It is classified under tariff item 9031.80.00 as an 'other instrument' for measuring or checking material properties, distinct from automatic control devices.
9031.80.00Hitachi EB-PageWriter Electron Beam Microscope
The Hitachi EB-PageWriter Electron Beam Microscope is equipped with specialized wafer handling stages and robotic arms for precise transport of semiconductor wafers during inspection. It falls under tariff item 9031.80.00 as an 'other instrument' for measuring or checking semiconductor features, given its metrology-focused design.
9031.80.00JEOL JSX-5000SPG Electron Beam Pattern Generator
The JEOL JSX-5000SPG Electron Beam Pattern Generator integrates electron beam metrology with precision reticle and wafer stage positioning systems for photomask manufacturing. It is classified under tariff item 9031.80.00 as an 'other instrument' for measuring or checking semiconductor patterns, distinct from lithography equipment.
9031.80.00KLA-Tencor eDR Series Electron Beam Defect Review System
The KLA-Tencor eDR Series Electron Beam Defect Review System combines electron beam imaging with robotic wafer transport for defect review on patterned semiconductor wafers. It falls under tariff item 9031.80.00 as an 'other instrument' for measuring or checking semiconductor defects, given its metrology and inspection functions.
9031.80.00Lux Meter Digital
The digital lux meter measures illuminance in lux for lighting design and safety compliance, functioning as a light measuring instrument. It falls under tariff item 9031.80.00 as an 'other instrument' for measuring or checking light, not covered by specific radiation or optical headings.
9031.80.00Profile Projector Screen
The profile projector screen is a replacement measuring screen with etched scales for optical profile projectors. It is classified under tariff item 9031.80.00 as an 'other instrument' for measuring or checking dimensions, specifically as a part of profile projectors.
9031.80.00Sound Level Meter Type 1
The Type 1 precision integrating sound level meter is designed for environmental noise monitoring, functioning as an acoustic measuring instrument. It falls under tariff item 9031.80.00 as an 'other instrument' for measuring or checking sound, not covered by automatic control headings.
9031.80.00Thermo Fisher Helios 5 DualBeam FIB-SEM
The Thermo Fisher Helios 5 DualBeam FIB-SEM combines focused ion beam milling with electron beam imaging, featuring semiconductor lift-out grids and wafer handling for sample preparation. It is classified under tariff item 9031.80.00 as an 'other instrument' for measuring or checking semiconductor structures, given its metrology and analysis functions.