Hitachi EB-PageWriter Electron Beam Microscope
The Hitachi EB-PageWriter is an electron beam microscope with specialized wafer handling stages and robotic arms for precise transport of semiconductor wafers during inspection. It qualifies under tariff item 9031.80.00 as an other measuring or checking instrument for semiconductor metrology.
Import Duty Rates by Country of Origin
| Origin Country | MFN Tariff | Surtaxes | Total Effective Rate |
|---|---|---|---|
| 🇨🇳China | Free | — | Free |
| 🇲🇽Mexico | Free | — | Free |
| 🇺🇸United States | Free | — | Free |
| 🇩🇪Germany | Free | — | Free |
| 🇯🇵Japan | Free | — | Free |
PGA flags
No agency flag on this HTS number in the CBSA Single Window matching criteria.
CBSA Single Window matching criteria, unknown
More Specific Codes
This product may fall under a more specific subheading:
Alternative Classifications
This product could be classified differently depending on its characteristics or intended use.
If the microscope is used for imaging applications
Electron microscopes for imaging may be classified under heading 90.12.
Not sure which classification is right?
The Tariff Assistant works through the GRI rules on your specific product to reach the right tariff item — and can price the duty on it in the same conversation.
Import Tips & Compliance
• Ensure the product is declared as a measuring instrument under 9031.80.00, not as general laboratory equipment
• Provide CBSA with technical manuals and a letter of explanation for the classification
• Verify if the equipment qualifies for any duty relief programs for scientific instruments
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