Hitachi EB-PageWriter Electron Beam Microscope from United States
The Hitachi EB-PageWriter Electron Beam Microscope is equipped with specialized wafer handling stages and robotic arms for precise transport of semiconductor wafers during inspection. It falls under tariff item 9031.80.00 as an 'other instrument' for measuring or checking semiconductor features, given its metrology-focused design.
Duty Rate — United States → Canada
0%
Import Tips
• Ensure the product is declared as a measuring instrument, not a general microscope, to align with tariff item 9031.80.00
• Provide the manufacturer's specification sheet showing the wafer handling and measurement capabilities
• Consider the Machinery Remission Program for potential duty savings if used in manufacturing