Chapter 9031 — Customs Tariff Headings

9031.20.00Test benches

9031.4Other optical instruments and appliances:

9031.80.00Other instruments, appliances and machines

9031.90Parts and accessories

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Products classified under Tariff item 90.31

Balancing Technologies Axis Balancing System

A computerized horizontal balancing machine designed for electric motor armatures and spindles. It measures unbalance and guides correction, falling under tariff item 9031.10.00 as a machine for balancing mechanical parts.

Cimbal Balancing Machine CMB-T4

A horizontal balancing machine for crankshafts and drive shafts in automotive manufacturing. It performs dynamic and static balancing, qualifying under 9031.10.00 as a machine for balancing mechanical parts.

DMG Mori Balancer for Turbine Rotors

A high-precision balancer for turbine rotors, integrated with CNC systems. The primary function is balancing mechanical parts, so it falls under 9031.10.00 despite the CNC interface.

Giramatic G-20 Drive Shaft Balancer

A dedicated balancer for propeller shafts and cardan shafts in heavy vehicles. It balances mechanical parts, fitting under 9031.10.00 as a machine for balancing mechanical parts.

Hoffmann Group Dynamic Balancing Machine USA-1

A precision dynamic balancing machine for automotive wheels and mechanical rotors up to 22 lbs. It uses vibration analysis to balance parts, qualifying under 9031.10.00.

Hofmann California Balancer Kit

A complete wheel balancing station for tire shops, including calibration weights. It balances wheels as mechanical parts, falling under 9031.10.00.

IRDM-50T Vertical Balancing Machine

A vertical single-plane balancer for turbocharger impellers and flywheels up to 110 lbs. It balances rotating mechanical parts, qualifying under 9031.10.00.

ProBal XL Fan Blade Balancing Machine

A large-scale balancer for industrial cooling tower fans and propeller blades. It balances oversized mechanical parts, falling under 9031.10.00.

Schenck RoTec TB 42 Turbo Balancer

A compact turbo balancer for high-speed turbine blades and small rotors in aerospace applications. It measures and corrects unbalance, qualifying under 9031.10.00.

Universal Balancing PB-2K Portable Balancer

A portable field balancing machine for on-site correction of industrial fans and pumps. It balances mechanical parts in their operational state, falling under 9031.10.00.

ABS Brake Test Bench

An ABS brake test bench is a specialized testing platform that simulates anti-lock braking system conditions to evaluate modulation, pressure dynamics, and wheel slip control. It falls under tariff item 9031.20.00 as a test bench used for measuring and checking the performance of vehicle subsystems, which is not specified elsewhere in Chapter 90.

Automotive Engine Test Bench

An automotive engine test bench is a comprehensive testing system for internal combustion engines, measuring parameters such as power output, torque, emissions, and fuel efficiency under controlled conditions. It qualifies under tariff item 9031.20.00 as a test bench for evaluating engine performance, which is a measuring or checking application not covered by other headings.

Battery Cycle Life Test Bench

A battery cycle life test bench is a multi-channel system for testing lithium-ion and other batteries, performing charge-discharge cycling to determine capacity fade, impedance, and safety limits. It falls under tariff item 9031.20.00 as a test bench for measuring battery performance, which is a checking instrument not specified elsewhere in Chapter 90.

Compressor Performance Test Bench

A compressor performance test bench is a platform for testing air or gas compressors, measuring capacity, efficiency, leakage, and operational parameters across speed ranges. It is classified under tariff item 9031.20.00 as a dedicated test bench for compressor performance, excluding automatic regulators which are covered by heading 9032.

Electric Motor Dynamometer Test Bench

An electric motor dynamometer test bench is equipped with a dynamometer for loading and precisely measuring the performance of electric motors, including torque, speed, efficiency, and temperature profiles. It falls under tariff item 9031.20.00 as a test bench for motor performance testing, which is a measuring or checking application not specified elsewhere.

Fuel Injector Test Bench

A fuel injector test bench is a high-pressure testing system for common-rail fuel injectors, measuring spray pattern, flow rate, response time, and durability. It is classified under tariff item 9031.20.00 for precision fuel system component testing, as it is a test bench for checking injector performance.

Hydraulic Pump Test Bench

A hydraulic pump test bench is a system for evaluating hydraulic pumps and systems, measuring flow rate, pressure, efficiency, and cavitation under variable loads. It qualifies under tariff item 9031.20.00 as a test bench for fluid power component testing, which is a measuring or checking application not covered by other headings.

Transmission Gearbox Test Bench

A transmission gearbox test bench is a dynamometer-based system for testing automotive and industrial gearboxes, assessing shift quality, efficiency, noise, vibration, and harshness (NVH). It falls under tariff item 9031.20.00 for its role in systematic performance testing of gearboxes, which is a measuring or checking application.

Turbine Blade Test Bench

A turbine blade test bench is a system for testing wind or gas turbine blades, evaluating aerodynamic performance, fatigue, and structural integrity under simulated loads. It is classified under tariff item 9031.20.00 for specialized aerodynamic testing, which is a measuring or checking application not specified elsewhere in Chapter 90.

Valve Flow Test Bench

A valve flow test bench is a precision system for testing control valves and regulators, quantifying flow coefficients (Cv/Kv), pressure drops, and leakage rates. It falls under tariff item 9031.20.00 for hydraulic and pneumatic valve performance testing, which is a measuring or checking application not covered by other headings.

3D NAND Wafer Structure Inspector

A 3D NAND wafer structure inspector is a specialized optical scatterometry system that measures 3D NAND flash memory structures on semiconductor wafers. It analyzes complex stacked layer dimensions critical for advanced memory device manufacturing. This product is classified under tariff item 9031.41.00 as an optical inspection instrument for semiconductor wafers.

Advanced Packaging Wafer Inspector

An advanced packaging wafer inspector is an optical inspection system designed for fan-out wafer-level packaging (FOWLP) semiconductor wafers. It checks redistribution layers and underfill voids, making it essential for heterogeneous integration in advanced semiconductor packaging. This product is classified under tariff item 9031.41.00 as an optical inspection instrument for semiconductor wafers.

Applied Materials UVision 4E Patterned Wafer Inspector

A high-resolution patterned wafer inspection tool using deep ultraviolet (DUV) optics to detect systematic and random defects on production semiconductor wafers. Essential for yield enhancement in advanced semiconductor nodes below 10nm, this system falls under tariff item 9031.41.00 as it is specifically designed for inspecting semiconductor wafers or devices.

Applied Materials Verifier Summit Reticle Inspector

A high-throughput reticle inspection platform using deep ultraviolet (DUV) illumination for detecting critical defects on advanced node photomasks. Features programmable defect classification and recipe-based inspection, and is classified under 9031.41.00 as it inspects photomasks or reticles.

ASML YieldStar Optical Metrology Tool

An overlay and focus metrology system for semiconductor wafers using diffraction-based optical measurements to ensure lithographic pattern accuracy. Used post-exposure to monitor process control in high-volume manufacturing, this tool is classified under 9031.41.00 as it inspects semiconductor wafers or devices.

Automated Wafer Particle Counter

This automated wafer particle counter is a dark-field optical microscope system that automatically counts and sizes contamination particles on unpatterned semiconductor wafers. It is critical for yield optimization in wafer fabrication cleanrooms. This product falls under tariff item 9031.41.00 as an optical instrument for inspecting semiconductor wafers.

BrightSpot Automation OWL Reticle Inspector

A programmable illumination reticle inspection system for photomask qualification using multiple wavelength sources and aerial image sensor technology. Used in semiconductor mask houses, this system is classified under 9031.41.00 as it inspects photomasks or reticles used in manufacturing semiconductor devices.

Bruker ContourGT Reticle Surface Profiler

A white light interferometric surface profiler optimized for measuring photomask blank surface roughness and topography critical for defect printability analysis. Sub-angstrom resolution meets semiconductor reticle specifications, and this system falls under 9031.41.00 as it inspects photomasks or reticles.

Camtek Eagle i 3D Wafer Metrology System

An advanced packaging 3D metrology system combining optical profilometry and color interferometry for micro-bump inspection on semiconductor wafers. Critical for heterogeneous integration processes, this tool falls under 9031.41.00 as it inspects semiconductor wafers or devices.

Camtek EagleR 3D Reticle Metrology System

The Camtek EagleR is a 3D optical metrology tool used to measure reticle surface topography, overlay marks, and critical dimensions on photomasks. It combines white light interferometry with pattern recognition to achieve sub-1nm precision, making it essential for semiconductor manufacturing quality control. This product falls under tariff item 9031.41.00 as an optical instrument specifically designed for inspecting photomasks and reticles used in semiconductor device production.

Confocal Wafer Surface Profiler

This confocal wafer surface profiler is a confocal laser scanning optical system that measures 3D topography of semiconductor wafer surfaces at nanometer resolution. It is used for characterizing chemical mechanical polishing (CMP) process uniformity. This instrument is classified under tariff item 9031.41.00 as an optical instrument for inspecting semiconductor wafers.

CyberOptics SQ3000 Reticle Dimension Metrology Tool

The CyberOptics SQ3000 is an advanced 3D dimension metrology system that uses structured light to measure photomask critical dimensions, sidewall angles, and overlay targets. It supports 5nm node requirements for mask qualification, ensuring precision in semiconductor manufacturing. This instrument is classified under tariff item 9031.41.00 as it is specifically designed for inspecting photomasks and reticles used in semiconductor device production.

Darkfield Wafer Inspection Microscope

This darkfield wafer inspection microscope is a high numerical aperture (NA) optical microscope optimized for detecting sub-micron particles on polished semiconductor wafers. It features an automated stage and pattern recognition software for efficient inspection. This product falls under tariff item 9031.41.00 as an optical instrument for inspecting semiconductor wafers.

Hitachi NSX Series Reticle Inspection System

A die-to-database reticle inspection system using transmitted and reflected light optics for photomask defect detection in semiconductor lithography. Critical for ensuring mask quality in leading-edge chip production, this system is classified under 9031.41.00 as it inspects photomasks or reticles.

KLA-Tencor 2935 Wafer Inspection System

An automated optical inspection system designed for detecting defects on unpatterned semiconductor wafers during manufacturing. It uses laser scanning and advanced imaging to inspect wafer surfaces for particles and scratches, falling under 9031.41.00 as it inspects semiconductor wafers.

KLA-Tencor 29xx Series Reticle Inspection System

The KLA-Tencor 29xx Series is an advanced optical inspection system designed specifically for detecting defects on photomasks and reticles used in semiconductor photolithography. It employs laser scanning and AI-driven pattern recognition to identify patterns and anomalies with high sensitivity. This system falls under tariff item 9031.41.00 as an optical instrument for inspecting photomasks and reticles in semiconductor manufacturing.

KLA-Tencor 8950E Patterned Wafer Inspector

A high-volume production patterned wafer inspection system with simultaneous frontside/backside inspection capability using programmable illumination. Detects defects down to 40nm, and is classified under 9031.41.00 as it inspects semiconductor wafers or devices.

KLA-Tencor Surfscan SP7 Unpatterned Wafer Scanner

A surface scanning system for bare silicon wafer defectivity mapping using multi-angle darkfield optics and UV laser excitation. Detects haze, flatness deviations, and particles down to 20nm, and is specifically for semiconductor wafer inspection under 9031.41.00.

KLA-Tencor Teron 640e EUV Reticle Blank Inspector

The KLA-Tencor Teron 640e is an extreme ultraviolet (EUV) reticle blank inspection system used to detect buried defects in multilayer blanks before patterning. It uses actinic wavelength inspection, which is critical for 7nm and below semiconductor nodes. This instrument is classified under tariff item 9031.41.00 as it is specifically designed for inspecting reticle blanks used in semiconductor device manufacturing.

Laser Doppler Wafer Vibrometer

This laser Doppler wafer vibrometer is a non-contact laser Doppler vibrometry system that measures wafer vibration modes and chucking stability during processing. It is critical for overlay improvement in semiconductor manufacturing. This instrument is classified under tariff item 9031.41.00 as an optical instrument for inspecting semiconductor wafers.

Lasertec M5650 EUV Blank Inspection System

An extreme ultraviolet (EUV) blank inspection system using actinic wavelength optics for multilayer defect detection on EUV photomasks. Essential for 3nm and below semiconductor nodes, this system falls under 9031.41.00 as it inspects photomasks or reticles.

Lasertec MAGICS M-7360 Reticle Inspection Tool

The Lasertec MAGICS M-7360 is a die-to-database reticle inspection system that uses proprietary MAGICS pattern matching for 10nm+ semiconductor nodes. It detects systematic and random defects on binary and phase-shift masks with ultra-high sensitivity. This system falls under tariff item 9031.41.00 as an optical instrument specifically for inspecting photomasks and reticles in semiconductor manufacturing.

Laser Wafer Overlay Metrology Tool

This laser wafer overlay metrology tool is a precision optical instrument that measures overlay alignment between multiple lithographic layers on semiconductor wafers. It employs interferometry and pattern recognition to ensure nanometer-level accuracy in wafer patterning. This product falls under tariff item 9031.41.00 as an optical instrument for inspecting semiconductor wafers.

Multi-Wavelength Wafer Metrology Tool

This multi-wavelength wafer metrology tool is a broadband spectrophotometry optical system that measures thin film stack thicknesses across entire semiconductor wafers. It is essential for process control in advanced semiconductor nodes. This instrument is classified under tariff item 9031.41.00 as an optical instrument for inspecting semiconductor wafers.

Nanophoton STARFYRE Reticle Defect Review Station

The Nanophoton STARFYRE is a near-field optical inspection station used for high-resolution review of defects identified by automated reticle inspection tools. It provides sub-50nm defect imaging on photomasks for semiconductor production. This product is classified under tariff item 9031.41.00 as an optical instrument for inspecting photomasks and reticles used in semiconductor device manufacturing.

Nanotronics NVAid Automated Wafer Inspector

An AI-powered wafer inspection platform combining brightfield, darkfield, and review SEM capabilities for comprehensive defect classification. Used in semiconductor fabs for process monitoring and yield analytics, this system is classified under 9031.41.00 as it inspects semiconductor wafers.

Nova V-R series OCD Metrology Tool

An Optical Critical Dimension (OCD) scatterometry system for semiconductor wafer film thickness and profile measurement using spectroscopic ellipsometry. Non-destructive process control for advanced nodes, this tool falls under 9031.41.00 as it inspects semiconductor wafers or devices.

Oblique Illumination Wafer Inspector

This oblique illumination wafer inspector is a specialized optical system that uses oblique angle illumination to enhance topographic defect visibility on patterned semiconductor wafers. It is ideal for detecting shallow pits and mounds. This product falls under tariff item 9031.41.00 as an optical instrument for inspecting semiconductor wafers.

Onto Innovation Firefly NDT Wafer Defect Review System

A high-throughput noise defect termination system for patterned wafer review using broadband plasma illumination and programmable apertures. Automates defect classification for semiconductor process control, and is classified under 9031.41.00 as it inspects semiconductor wafers.

Onto Innovation Firefly NPI Reticle Scanner

The Onto Innovation Firefly NPI is a programmable reticle scanner used for new product introduction phases, combining aerial image simulation with defect inspection for photomask qualification. It is critical for qualifying masks before high-volume manufacturing. This system falls under tariff item 9031.41.00 as an optical instrument for inspecting photomasks and reticles in semiconductor production.

Phase Shift Wafer Inspection System

A phase shift wafer inspection system uses coherence scanning interferometry to characterize semiconductor wafer surfaces at angstrom-level precision. It detects subtle thickness variations that standard optical systems cannot resolve, making it essential for advanced semiconductor manufacturing quality control. This product falls under tariff item 9031.41.00 as an optical instrument specifically designed for inspecting semiconductor wafers.

Structured Light Wafer Scanner

A structured light wafer scanner uses fringe projection to perform full-field 3D shape measurement of semiconductor wafers. It detects subtle global distortions that can affect lithography overlay accuracy. This optical system is classified under tariff item 9031.41.00 as it is specifically designed for inspecting semiconductor wafers.

Toray Engineering CIRCL-100 Photomask Inspector

A programmable spatial frequency response inspection system for binary and phase-shift photomasks using aerial image simulation technology. Ensures photomask CD uniformity and defect-free patterns for semiconductor production, falling under 9031.41.00 as it inspects photomasks or reticles.

UV Wafer Edge Inspection System

A UV wafer edge inspection system uses ultraviolet optical imaging to detect micro-cracks, chipping, and contamination along semiconductor wafer edges. It helps prevent handling defects during robotic transfer in semiconductor fabrication facilities. This product is classified under tariff item 9031.41.00 as an optical inspection instrument for semiconductor wafers.

Wafer Bow/Warp Optical Analyzer

A wafer bow/warp optical analyzer uses laser reflection to measure wafer bow, warp, and total thickness variation across 300mm semiconductor wafers. It is critical for stress analysis after deposition processes in semiconductor manufacturing. This optical measurement system falls under tariff item 9031.41.00 as it is designed for inspecting semiconductor wafers.

Wafer Critical Dimension SEM

A wafer critical dimension SEM is a scanning electron microscope with optical pre-alignment for measuring critical dimensions on semiconductor wafers post-lithography. Although it primarily uses an electron beam, it includes essential optical wafer handling and positioning systems. This product is classified under tariff item 9031.41.00 because of its optical inspection components for semiconductor wafers.

Wafer Flatness Profiler

A wafer flatness profiler uses white light interferometry to measure wafer thickness variation and surface flatness. It ensures silicon wafer planarity before lithographic processing in semiconductor manufacturing. This non-contact optical profiler is classified under tariff item 9031.41.00 as an inspection instrument for semiconductor wafers.

Wafer Patterned Film Inspector

A wafer patterned film inspector uses ellipso-polarimetric optical technology to inspect thin film stress and thickness uniformity on patterned semiconductor wafers. It uses multiple angles of incidence for complete characterization of deposited films. This advanced optical system is classified under tariff item 9031.41.00 for semiconductor wafer inspection.

Wafer Surface Defect Scanner

A wafer surface defect scanner is an optical inspection system designed to detect microscopic defects on semiconductor wafers during manufacturing. It uses laser scanning and high-resolution imaging to identify particles, scratches, and other surface irregularities. This product is classified under tariff item 9031.41.00 as an optical inspection instrument for semiconductor wafers.