KLA-Tencor 8950E Patterned Wafer Inspector
A high-volume production patterned wafer inspection system with simultaneous frontside/backside inspection capability using programmable illumination. Detects defects down to 40nm, and is classified under 9031.41.00 as it inspects semiconductor wafers or devices.
Import Duty Rates by Country of Origin
| Origin Country | MFN Tariff | Surtaxes | Total Effective Rate |
|---|---|---|---|
| 🇨🇳China | Free | — | Free |
| 🇲🇽Mexico | Free | — | Free |
| 🇺🇸United States | Free | — | Free |
| 🇩🇪Germany | Free | — | Free |
| 🇯🇵Japan | Free | — | Free |
More Specific Codes
This product may fall under a more specific subheading:
Alternative Classifications
This product could be classified differently depending on its characteristics or intended use.
If the system inspects non-semiconductor wafers
Other optical inspection instruments fall under this item.
Not sure which classification is right?
The Tariff Assistant works through the GRI rules on your specific product to reach the right tariff item — and can price the duty on it in the same conversation.
Import Tips & Compliance
• Declare under 9031.41.00 as an optical instrument for semiconductor wafer inspection
• Keep technical documentation to prove its specific use
• Verify eligibility for duty remission under the Machinery Program
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