KLA-Tencor 8950E Patterned Wafer Inspector from Germany
A high-volume production patterned wafer inspection system with simultaneous frontside/backside inspection capability using programmable illumination. Detects defects down to 40nm, and is classified under 9031.41.00 as it inspects semiconductor wafers or devices.
Duty Rate — Germany → Canada
0%
Import Tips
• Declare under 9031.41.00 as an optical instrument for semiconductor wafer inspection
• Keep technical documentation to prove its specific use
• Verify eligibility for duty remission under the Machinery Program