JEOL JSX-5000SPG Electron Beam Pattern Generator
The JEOL JSX-5000SPG integrates electron beam metrology with precision reticle and wafer stage positioning systems for photomask manufacturing. It falls under tariff item 9031.80.00 as an other measuring or checking instrument, not specified elsewhere in Chapter 90.
Import Duty Rates by Country of Origin
| Origin Country | MFN Tariff | Surtaxes | Total Effective Rate |
|---|---|---|---|
| 🇨🇳China | Free | — | Free |
| 🇲🇽Mexico | Free | — | Free |
| 🇺🇸United States | Free | — | Free |
| 🇩🇪Germany | Free | — | Free |
| 🇯🇵Japan | Free | — | Free |
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No agency flag on this HTS number in the CBSA Single Window matching criteria.
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More Specific Codes
This product may fall under a more specific subheading:
Alternative Classifications
This product could be classified differently depending on its characteristics or intended use.
If the system is used for imaging rather than measurement
Electron beam instruments for imaging may fall under heading 90.12.
Not sure which classification is right?
The Tariff Assistant works through the GRI rules on your specific product to reach the right tariff item — and can price the duty on it in the same conversation.
Import Tips & Compliance
• Classify the system under 9031.80.00 as a measuring instrument for semiconductor manufacturing
• Provide CBSA with detailed specifications showing its metrology functions
• Ensure compliance with any export or import controls for advanced manufacturing equipment
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