JEOL JSX-5000SPG Electron Beam Pattern Generator
The JEOL JSX-5000SPG Electron Beam Pattern Generator integrates electron beam metrology with precision reticle and wafer stage positioning systems for photomask manufacturing. It is classified under tariff item 9031.80.00 as an 'other instrument' for measuring or checking semiconductor patterns, distinct from lithography equipment.
Import Duty Rates by Country of Origin
| Origin Country | MFN Tariff | Surtaxes | Total Effective Rate |
|---|---|---|---|
| 🇨🇳China | Free | — | Free |
| 🇲🇽Mexico | Free | — | Free |
| 🇺🇸United States | Free | — | Free |
| 🇩🇪Germany | Free | — | Free |
| 🇯🇵Japan | Free | — | Free |
More Specific Codes
This product may fall under a more specific subheading:
Alternative Classifications
This product could be classified differently depending on its characteristics or intended use.
If the system is used for imaging rather than pattern measurement
Microscopes for imaging may be classified under heading 90.12.
Not sure which classification is right?
The Tariff Assistant works through the GRI rules on your specific product to reach the right tariff item — and can price the duty on it in the same conversation.
Import Tips & Compliance
• Classify the system as a measuring instrument for photomask patterns, not as a lithography machine
• Include the stage positioning accuracy specifications in the import documentation
• Verify if the equipment qualifies for duty relief under the Machinery Remission Program
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