JEOL JSX-5000SPG Electron Beam Pattern Generator from China
The JEOL JSX-5000SPG integrates electron beam metrology with precision reticle and wafer stage positioning systems for photomask manufacturing. It falls under tariff item 9031.80.00 as an other measuring or checking instrument, not specified elsewhere in Chapter 90.
Duty Rate — China → Canada
0%
PGA flags
No agency flag on this HTS number in the CBSA Single Window matching criteria.
CBSA Single Window matching criteria, unknown
Import Tips
• Classify the system under 9031.80.00 as a measuring instrument for semiconductor manufacturing
• Provide CBSA with detailed specifications showing its metrology functions
• Ensure compliance with any export or import controls for advanced manufacturing equipment