Camtek Eagle i 3D Electron Beam Metrology System
The Camtek Eagle i 3D Electron Beam Metrology System provides 3D metrology with automated wafer mapping and handling for advanced packaging inspection. It is classified under tariff item 9031.80.00 as an 'other instrument' for measuring or checking semiconductor structures, distinct from optical inspection devices.
Import Duty Rates by Country of Origin
| Origin Country | MFN Tariff | Surtaxes | Total Effective Rate |
|---|---|---|---|
| 🇨🇳China | Free | — | Free |
| 🇲🇽Mexico | Free | — | Free |
| 🇺🇸United States | Free | — | Free |
| 🇩🇪Germany | Free | — | Free |
| 🇯🇵Japan | Free | — | Free |
More Specific Codes
This product may fall under a more specific subheading:
Alternative Classifications
This product could be classified differently depending on its characteristics or intended use.
If the system is used for defect imaging rather than dimensional measurement
Microscopes used for imaging purposes may be classified under heading 90.12.
Not sure which classification is right?
The Tariff Assistant works through the GRI rules on your specific product to reach the right tariff item — and can price the duty on it in the same conversation.
Import Tips & Compliance
• Classify the system as a measuring instrument for semiconductor wafers, not as a general inspection machine
• Include the system's software and calibration certificates in the import documentation to confirm its metrology function
• Check if the equipment is eligible for the Accelerated Remission Program for machinery used in manufacturing
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