Camtek Eagle i 3D Electron Beam Metrology System from Japan
The Camtek Eagle i 3D electron beam metrology system provides automated wafer mapping and handling for advanced packaging inspection. It is classified under tariff item 9031.80.00 as an other measuring or checking instrument, given its role in semiconductor metrology and inspection.
Duty Rate — Japan → Canada
0%
Import Tips
• Classify the system under 9031.80.00 as a measuring instrument, not as a machine of Chapter 84
• Prepare a detailed product description and technical specifications for CBSA review
• Check for any end-use certificates or permits required for advanced technology imports