Camtek Eagle i 3D Electron Beam Metrology System from Mexico
The Camtek Eagle i 3D Electron Beam Metrology System provides 3D metrology with automated wafer mapping and handling for advanced packaging inspection. It is classified under tariff item 9031.80.00 as an 'other instrument' for measuring or checking semiconductor structures, distinct from optical inspection devices.
Duty Rate — Mexico → Canada
0%
Import Tips
• Classify the system as a measuring instrument for semiconductor wafers, not as a general inspection machine
• Include the system's software and calibration certificates in the import documentation to confirm its metrology function
• Check if the equipment is eligible for the Accelerated Remission Program for machinery used in manufacturing