Integrated Circuit Tester Prober Station
Automated prober station that electrically tests individual ICs and devices on wafers for functionality before dicing. Includes probe cards and test head interfaces. Classified in HTS 9030.82.00.00 for checking semiconductor devices including integrated circuits.
Import Duty Rates by Country of Origin
| Origin Country | MFN Rate | Ch.99 Surcharges | Total Effective Rate |
|---|---|---|---|
| 🇨🇳China | Free | +35.0% | 35% |
| 🇲🇽Mexico | Free | +10.0% | 10% |
| 🇨🇦Canada | Free | +10.0% | 10% |
| 🇩🇪Germany | Free | +10.0% | 10% |
| 🇯🇵Japan | Free | +10.0% | 10% |
Alternative Classifications
This product could be classified differently depending on its characteristics or intended use.
If for general electronic circuit board testing
Multifunctional electrical testers not specific to ICs or wafers classified under other electrical instruments.
If for other electrical quantities not semiconductor-specific
General spectrum analyzers or oscilloscopes for electronics go to 9030.84.
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Import Tips & Compliance
• Declare probe card specifications and test voltage parameters to distinguish from general electrical meters
• Include semiconductor fabrication cleanroom compatibility certification in import docs
• Watch for reclassification risk if missing IC-specific test algorithms documentation
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