Integrated Circuit Tester Prober Station from Mexico
Automated prober station that electrically tests individual ICs and devices on wafers for functionality before dicing. Includes probe cards and test head interfaces. Classified in HTS 9030.82.00.00 for checking semiconductor devices including integrated circuits.
Duty Rate — Mexico → United States
0%
Rate breakdown
9903.05.860%Articles provided for in subdivision (b) of U.S. note 52 to this subchapter
Import Tips
• Declare probe card specifications and test voltage parameters to distinguish from general electrical meters
• Include semiconductor fabrication cleanroom compatibility certification in import docs
• Watch for reclassification risk if missing IC-specific test algorithms documentation