9030.82.00.00/Integrated Circuit Tester Prober Station/China

Integrated Circuit Tester Prober Station from China

Automated prober station that electrically tests individual ICs and devices on wafers for functionality before dicing. Includes probe cards and test head interfaces. Classified in HTS 9030.82.00.00 for checking semiconductor devices including integrated circuits.

Duty Rate — China → United States

25%

Rate breakdown

9903.88.0125%Except as provided in headings 9903.88.05, 9903.88.06, 9903.88.07, 9903.88.08, 9903.88.10, 9903.88.11, 9903.88.14, 9903.88.19, 9903.88.50, 9903.88.52, 9903.88.58, 9903.88.60, 9903.88.62, 9903.88.66, 9903.88.67, 9903.88.68, or 9903.88.69, articles the product of China, as provided for in U.S. note 20(a) to this subchapter and as provided for in the subheadings enumerated in U.S. note 20(b) [to this subchapter]

9903.05.860%Universal product exemption (U.S. note 52(b))

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Import Tips

• Declare probe card specifications and test voltage parameters to distinguish from general electrical meters

• Include semiconductor fabrication cleanroom compatibility certification in import docs

• Watch for reclassification risk if missing IC-specific test algorithms documentation