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For measuring or checking semiconductor wafers or devices (including integrated circuits)

Oscilloscopes, spectrum analyzers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of heading 9028; instruments and apparatus for measuring or detecting alpha, beta, gamma, X-ray, cosmic or other ionizing radiations; parts and accessories thereof: > Other instruments and apparatus: > For measuring or checking semiconductor wafers or devices (including integrated circuits)

Duty Rate (from China)

10%

MFN Base RateFree

9903.03.01+10%

Except for products described in headings 9903.03.02–9903.03.11, articles the product of any country, as provided for in subdivision (aa) of U.S. note 2 to this subchapter

Total Effective Rate10%

Subheadings

9030.82.00.00For measuring or checking semiconductor wafers or devices (including integrated circuits)

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