FormFactor Meridian Wafer Prober
MEMS-based probe card for high-speed semiconductor wafer electrical testing at <1,000V. Specifically covered under HTS 8536.90.4000 as wafer probers.
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Alternative Classifications
This product could be classified differently depending on its characteristics or intended use.
If semiconductor manufacturing machines
Parts of wafer processing equipment.
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Import Tips & Compliance
• Classify probe arrays separately from handler systems
• Export control docs for high-tech probes
• Distinguish from optical inspection (9013)
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