FormFactor Meridian Wafer Prober from Mexico
MEMS-based probe card for high-speed semiconductor wafer electrical testing at <1,000V. Specifically covered under HTS 8536.90.4000 as wafer probers.
Duty Rate — Mexico → United States
10%
Rate breakdown
9903.03.0110%Except for products described in headings 9903.03.02–9903.03.11, articles the product of any country, as provided for in subdivision (aa) of U.S. note 2 to this subchapter
Import Tips
• Classify probe arrays separately from handler systems
• Export control docs for high-tech probes
• Distinguish from optical inspection (9013)