FormFactor Meridian Wafer Prober from Canada
MEMS-based probe card for high-speed semiconductor wafer electrical testing at <1,000V. Specifically covered under HTS 8536.90.4000 as wafer probers.
Duty Rate — Canada → United States
10%
Rate breakdown
9903.05.2910%Except for products described in headings 9903.05.85–9903.05.93, articles the product of Canada, as provided for in U.S. note 52 to this subchapter
Import Tips
• Classify probe arrays separately from handler systems
• Export control docs for high-tech probes
• Distinguish from optical inspection (9013)