FormFactor Meridian Wafer Prober from Japan
MEMS-based probe card for high-speed semiconductor wafer electrical testing at <1,000V. Specifically covered under HTS 8536.90.4000 as wafer probers.
Duty Rate — Japan → United States
12.5%
Rate breakdown
9903.05.4912.5%Section 301 (forced labor) — Japan (col1 rate < 12.5 percent): MFN < 12.5% → total duty capped at 12.5%
Import Tips
• Classify probe arrays separately from handler systems
• Export control docs for high-tech probes
• Distinguish from optical inspection (9013)