FormFactor Meridian Wafer Prober from Japan
MEMS-based probe card for high-speed semiconductor wafer electrical testing at <1,000V. Specifically covered under HTS 8536.90.4000 as wafer probers.
Duty Rate — Japan → United States
12.5%
Rate breakdown
9903.05.4912.5%Except for products described in headings 9903.05.85–9903.05.92, articles the product of Japan, with an ad valorem (or ad valorem equivalent) rate of duty under column 1 less than 12.5 percent, as provided for in U.S. note 52 to this subchapter
Import Tips
• Classify probe arrays separately from handler systems
• Export control docs for high-tech probes
• Distinguish from optical inspection (9013)