Wafer Thickness Measurement Gauge

In-line metrology tool that precisely measures semiconductor wafer thickness during grinding/lapping operations. Classified HTS 8471.90.00.00 as semiconductor processing control equipment.

Import Duty Rates by Country of Origin

Origin CountryMFN RateCh.99 SurchargesTotal Effective Rate
šŸ‡ØšŸ‡³ChinaFree+50.0%50%
šŸ‡²šŸ‡½MexicoFree+25.0%25%
šŸ‡ØšŸ‡¦CanadaFree+25.0%25%
šŸ‡©šŸ‡ŖGermanyFree+15.0%15%
šŸ‡ÆšŸ‡µJapanFree+15.0%15%

Alternative Classifications

This product could be classified differently depending on its characteristics or intended use.

9031.80.80Lower: 35% vs 50%

If general measuring instruments

Non-specialized measuring devices under Chapter 90.

9031.49Lower: 10% vs 50%

If imported as optical measuring system

Optical profile projectors and similar devices classified separately.

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Import Tips & Compliance

• Provide measurement accuracy, repeatability, and integration specifications

• Include capacitive/optical sensing technology documentation

• Distinguish from general gauges with semiconductor thin-film requirements