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Wafer Thickness Measurement Gauge

In-line metrology tool that precisely measures semiconductor wafer thickness during grinding/lapping operations. Classified HTS 8471.90.00.00 as semiconductor processing control equipment.

Import Duty Rates by Country of Origin

Origin CountryMFN RateCh.99 SurchargesTotal Effective Rate
šŸ‡ØšŸ‡³ChinaFree+50.0%50%
šŸ‡²šŸ‡½MexicoFree+25.0%25%
šŸ‡ØšŸ‡¦CanadaFree+25.0%25%
šŸ‡©šŸ‡ŖGermanyFree+15.0%15%
šŸ‡ÆšŸ‡µJapanFree+15.0%15%

Alternative Classifications

This product could be classified differently depending on its characteristics or intended use.

9031.80.80Lower: 37.5% vs 50%

If general measuring instruments

Non-specialized measuring devices under Chapter 90.

9031.49Lower: 12.5% vs 50%

If imported as optical measuring system

Optical profile projectors and similar devices classified separately.

Not sure which classification is right?

The Tariff Assistant works through the GRI rules on your specific product to reach the right HTS code — and can price the duty on it in the same conversation.

Import Tips & Compliance

• Provide measurement accuracy, repeatability, and integration specifications

• Include capacitive/optical sensing technology documentation

• Distinguish from general gauges with semiconductor thin-film requirements