Wafer Thickness Measurement Gauge from Mexico
In-line metrology tool that precisely measures semiconductor wafer thickness during grinding/lapping operations. Classified HTS 8471.90.00.00 as semiconductor processing control equipment.
Duty Rate — Mexico → United States
25%
Rate breakdown
9903.94.0525%Except for products described in headings 9903.94.06, 9903.94.32, 9903.94.33, 9903.94.42, 9903.94.43, 9903.94.44, 9903.94.45, 9903.94.52, 9903.94.53, 9903.94.54, 9903.94.55, 9903.94.62, 9903.94.63, 9903.94.66 and 9903.94.67, automobile parts, as provided for in subdivision (g) of U.S. note 33 to this subchapter
9903.05.860%Universal product exemption (U.S. note 52(b))
9903.05.900%Articles already subject to Section 232 (steel/aluminum/copper + derivatives, autos + parts, wood, medium/heavy vehicles + parts, semiconductors, patented pharma) — U.S. note 52(f)
Import Tips
• Provide measurement accuracy, repeatability, and integration specifications
• Include capacitive/optical sensing technology documentation
• Distinguish from general gauges with semiconductor thin-film requirements