Wafer Prober Vacuum Pump Assembly
Vacuum pump component for wafer probers that test semiconductor devices electrically after processing. Provides vacuum for probe card alignment and wafer manipulation during testing operations. Although testing equipment primarily in Chapter 90, certain vacuum handling parts remain in 8414.90.91 per semiconductor notes.
Import Duty Rates by Country of Origin
| Origin Country | MFN Rate | Ch.99 Surcharges | Total Effective Rate |
|---|---|---|---|
| 🇨🇳China | Free | +35.0% | 35% |
| 🇲🇽Mexico | Free | +10.0% | 10% |
| 🇨🇦Canada | Free | +10.0% | 10% |
| 🇩🇪Germany | Free | +10.0% | 10% |
| 🇯🇵Japan | Free | +10.0% | 10% |
More Specific Codes
This product may fall under a more specific subheading:
Alternative Classifications
This product could be classified differently depending on its characteristics or intended use.
If integral to electrical testing apparatus
Semiconductor testing equipment parts primarily classified in Chapter 90.
If general test fixture vacuum pumps
Non-semiconductor testing vacuum parts in other subheadings.
If as automated handling equipment
Wafer handling robots classified as semiconductor machines.
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Import Tips & Compliance
• Clarify pump's role in physical wafer handling vs electrical testing to maintain 8414 classification
• Include prober specifications showing vacuum chuck function for wafer positioning
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