Wafer Prober Vacuum Pump Assembly from Japan
Vacuum pump component for wafer probers that test semiconductor devices electrically after processing. Provides vacuum for probe card alignment and wafer manipulation during testing operations. Although testing equipment primarily in Chapter 90, certain vacuum handling parts remain in 8414.90.91 per semiconductor notes.
Duty Rate — Japan → United States
12.5%
Rate breakdown
9903.05.4912.5%Section 301 (forced labor) — Japan (col1 rate < 12.5 percent): MFN < 12.5% → total duty capped at 12.5%
Import Tips
• Clarify pump's role in physical wafer handling vs electrical testing to maintain 8414 classification
• Include prober specifications showing vacuum chuck function for wafer positioning