Wafer Prober Vacuum Pump Assembly from Japan
Vacuum pump component for wafer probers that test semiconductor devices electrically after processing. Provides vacuum for probe card alignment and wafer manipulation during testing operations. Although testing equipment primarily in Chapter 90, certain vacuum handling parts remain in 8414.90.91 per semiconductor notes.
Duty Rate — Japan → United States
12.5%
Rate breakdown
9903.05.4912.5%Except for products described in headings 9903.05.85–9903.05.92, articles the product of Japan, with an ad valorem (or ad valorem equivalent) rate of duty under column 1 less than 12.5 percent, as provided for in U.S. note 52 to this subchapter
Import Tips
• Clarify pump's role in physical wafer handling vs electrical testing to maintain 8414 classification
• Include prober specifications showing vacuum chuck function for wafer positioning