Wafer Particle Counter Scanner
A wafer particle counter scanner uses laser scattering to scan wafers and count/size contamination particles that could cause IC defects. It meets strict cleanroom standards for semiconductor production, ensuring wafer cleanliness.
Import Duty Rates by Country of Origin
| Origin Country | MFN Tariff | Surtaxes | Total Effective Rate |
|---|---|---|---|
| 🇨🇳China | Free | — | Free |
| 🇲🇽Mexico | Free | — | Free |
| 🇺🇸United States | Free | — | Free |
| 🇩🇪Germany | Free | — | Free |
| 🇯🇵Japan | Free | — | Free |
More Specific Codes
This product may fall under a more specific subheading:
Alternative Classifications
This product could be classified differently depending on its characteristics or intended use.
If the scanner is used for general particle counting not specific to semiconductor wafers.
Other optical measuring instruments may be classified under 9031.49.00.
If the scanner uses optical radiation for analysis of particles in air or liquids.
Instruments using optical radiation for analysis may be covered under 9027.50.00.
Not sure which classification is right?
The Tariff Assistant works through the GRI rules on your specific product to reach the right tariff item — and can price the duty on it in the same conversation.
Import Tips & Compliance
• Ensure the scanner is classified under 9030.82.00 as it checks semiconductor wafers for particles
• Provide CBSA with a detailed description of the laser scattering technique and particle detection capabilities
• Verify if the scanner requires any laser safety certifications for import
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