Integrated Circuit Tester Prober Station
An integrated circuit tester prober station automatically electrically tests individual ICs and devices on wafers before dicing. It includes probe cards and test head interfaces, ensuring functionality of semiconductor devices at the wafer level.
Import Duty Rates by Country of Origin
| Origin Country | MFN Tariff | Surtaxes | Total Effective Rate |
|---|---|---|---|
| 🇨🇳China | Free | — | Free |
| 🇲🇽Mexico | Free | — | Free |
| 🇺🇸United States | Free | — | Free |
| 🇩🇪Germany | Free | — | Free |
| 🇯🇵Japan | Free | — | Free |
More Specific Codes
This product may fall under a more specific subheading:
Alternative Classifications
This product could be classified differently depending on its characteristics or intended use.
If the prober tests devices after singulation or in packaged form.
Testing of individual semiconductor devices after dicing is covered under 9030.89.00.
If the prober is primarily for handling wafers during manufacturing.
Machines for the manufacture of semiconductor devices may fall under 8486.20.00.
Not sure which classification is right?
The Tariff Assistant works through the GRI rules on your specific product to reach the right tariff item — and can price the duty on it in the same conversation.
Import Tips & Compliance
• Classify the prober station under 9030.82.00 as it checks semiconductor devices on wafers
• Provide CBSA with a detailed description of the probing and testing functions
• Ensure the equipment complies with Canadian workplace safety standards for automated machinery
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