Integrated Circuit Tester Prober Station from Japan
An integrated circuit tester prober station automatically electrically tests individual ICs and devices on wafers before dicing. It includes probe cards and test head interfaces, ensuring functionality of semiconductor devices at the wafer level.
Duty Rate — Japan → Canada
0%
Import Tips
• Classify the prober station under 9030.82.00 as it checks semiconductor devices on wafers
• Provide CBSA with a detailed description of the probing and testing functions
• Ensure the equipment complies with Canadian workplace safety standards for automated machinery