For measuring or checking semiconductor wafers or devices (including integrated circuits)
Oscilloscopes, spectrum analyzers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of heading 90.28; instruments and apparatus for measuring or detecting alpha, beta, gamma, X-ray, cosmic or other ionizing radiations. > Other instruments and apparatus: > For measuring or checking semiconductor wafers or devices (including integrated circuits) > For measuring or checking semiconductor wafers or devices (including integrated circuits) > For measuring or checking semiconductor wafers or devices (including integrated circuits)
Duty Rate (from China)
Products classified under Tariff item 9030.82.00
3D NAND Wafer Overlay Metrology Tool
A scatterometry-based overlay metrology tool designed for measuring overlay accuracy between multiple layers in 3D NAND flash memory wafers. It uses optical techniques to non-destructively check alignment during semiconductor fabrication, ensuring high-density memory production quality. This instrument falls under tariff item 9030.82.00 as it is specifically for measuring or checking semiconductor wafers.
Advanced Packaging Wafer Test Handler
An automated wafer test handler that probes known good die on wafers for advanced packaging applications, including interposer and through-silicon via structures. It electrically tests semiconductor devices before dicing, ensuring functionality in 2.5D and 3D IC packaging. This equipment is classified under tariff item 9030.82.00 as it is designed for measuring or checking semiconductor devices.
Automated Wafer Alignment Verification System
A machine vision system that verifies fiducial marks and alignment features on semiconductor wafers for photolithography stepper accuracy. It ensures precise multi-layer IC patterning by checking alignment before exposure. This instrument falls under tariff item 9030.82.00 as it is used for measuring or checking semiconductor wafers.
Compound Semiconductor Wafer Analyzer
A multi-technique analyzer for compound semiconductor wafers such as GaAs, GaN, and SiC, measuring sheet resistance, carrier mobility, and Hall effect. It is essential for RF and power electronics production, providing critical electrical characterization. This instrument is classified under tariff item 9030.82.00 as it measures or checks semiconductor wafers.
IC Parametric Electrical Analyzer
A precision instrument that tests electrical parameters of individual transistors and ICs on wafers for process control monitoring, measuring leakage current, threshold voltage, and other characteristics. It is used during semiconductor fabrication to ensure device quality. This instrument falls under tariff item 9030.82.00 as it is specifically for measuring or checking semiconductor devices.
Integrated Circuit Tester Prober Station
An automated prober station that electrically tests individual ICs and devices on wafers for functionality before dicing. It includes probe cards and test head interfaces to ensure semiconductor devices meet specifications. This equipment is classified under tariff item 9030.82.00 as it is used for measuring or checking semiconductor devices.
LED Wafer Testing Microprobe Station
A microprobe station for electrically characterizing LED chips and microLED arrays on wafers before singulation, testing luminous efficacy, forward voltage, and other parameters. It is used in semiconductor manufacturing to ensure LED device quality. This instrument falls under tariff item 9030.82.00 as it measures or checks semiconductor devices, including optoelectronic devices.
Power Semiconductor Wafer Mapper
A high-voltage probe system that maps electrical characteristics of power device wafers such as MOSFETs and IGBTs, testing breakdown voltage distribution for automotive and energy applications. It is used in semiconductor fabrication to ensure power device reliability. This equipment is classified under tariff item 9030.82.00 as it measures or checks semiconductor wafers.
Semiconductor Wafer Resistivity Mapping System
A four-point probe system that maps resistivity variation across silicon wafers to monitor doping uniformity in IC fabrication, generating 2D and 3D resistivity maps. It is essential for ensuring wafer quality in semiconductor manufacturing. This instrument falls under tariff item 9030.82.00 as it measures or checks semiconductor wafers.
Semiconductor Wafer Thickness Profiler
A non-contact laser profiler that measures wafer thickness variation across the entire surface to ensure uniformity for IC production, detecting deviations down to nanometers. It is used in semiconductor manufacturing for quality control. This instrument is classified under tariff item 9030.82.00 as it measures or checks semiconductor wafers.
Silicon Wafer Bow and Warp Metrology Tool
A capacitive and optical instrument that measures wafer bow, warp, and flatness, which are critical for lithography alignment in IC fabrication, supporting 300mm wafers. It ensures wafer geometry meets specifications for semiconductor production. This equipment falls under tariff item 9030.82.00 as it measures or checks semiconductor wafers.
Wafer Defect Inspection System
An optical and laser-based system that detects defects on silicon wafers during semiconductor manufacturing, measuring surface irregularities, particles, and pattern errors on wafers up to 300mm. It is used for quality control in IC fabrication. This instrument is classified under tariff item 9030.82.00 as it measures or checks semiconductor wafers.
Wafer Edge Profilometer
A specialized profilometer that measures edge geometry, chipping, and micro-cracks on semiconductor wafers, affecting handling and yield, critical for 300mm wafer processing. It ensures wafer edge quality in semiconductor manufacturing. This equipment falls under tariff item 9030.82.00 as it measures or checks semiconductor wafers.
Wafer-Level Burn-in Test System
A temperature-controlled chamber with probe cards that stresses entire wafers at elevated temperatures to screen infant mortality in ICs, monitoring electrical parameters during burn-in. It is used in semiconductor manufacturing to ensure device reliability. This instrument is classified under tariff item 9030.82.00 as it measures or checks semiconductor devices.
Wafer Particle Counter Scanner
A laser scattering system that scans wafers to count and size contamination particles that could cause IC defects, meeting strict cleanroom standards for semiconductor production. It is used for quality control in wafer fabrication. This equipment falls under tariff item 9030.82.00 as it measures or checks semiconductor wafers.