Advanced Packaging Wafer Test Handler
An automated wafer test handler that probes known good die on wafers for advanced packaging applications, including interposer and through-silicon via structures. It electrically tests semiconductor devices before dicing, ensuring functionality in 2.5D and 3D IC packaging. This equipment is classified under tariff item 9030.82.00 as it is designed for measuring or checking semiconductor devices.
Import Duty Rates by Country of Origin
| Origin Country | MFN Tariff | Surtaxes | Total Effective Rate |
|---|---|---|---|
| 🇨🇳China | Free | — | Free |
| 🇲🇽Mexico | Free | — | Free |
| 🇺🇸United States | Free | — | Free |
| 🇩🇪Germany | Free | — | Free |
| 🇯🇵Japan | Free | — | Free |
More Specific Codes
This product may fall under a more specific subheading:
Alternative Classifications
This product could be classified differently depending on its characteristics or intended use.
If the handler includes optical inspection features that are not incidental to electrical testing
Heading 90.31 includes optical measuring instruments, and subheading 9031.49 covers other optical instruments for inspecting semiconductor wafers.
Not sure which classification is right?
The Tariff Assistant works through the GRI rules on your specific product to reach the right tariff item — and can price the duty on it in the same conversation.
Import Tips & Compliance
• Classify the handler under 9030.82.00 and include probe cards and interfaces as part of the machine if imported together
• Check if the equipment is eligible for the Accelerated Capital Cost Allowance for clean energy or manufacturing equipment
• Ensure the CBSA declaration includes the model and serial number to facilitate customs clearance
Related Products under Tariff item 9030.82.00
3D NAND Wafer Overlay Metrology Tool
A scatterometry-based overlay metrology tool designed for measuring overlay accuracy between multiple layers in 3D NAND flash memory wafers. It uses optical techniques to non-destructively check alignment during semiconductor fabrication, ensuring high-density memory production quality. This instrument falls under tariff item 9030.82.00 as it is specifically for measuring or checking semiconductor wafers.
Automated Wafer Alignment Verification System
A machine vision system that verifies fiducial marks and alignment features on semiconductor wafers for photolithography stepper accuracy. It ensures precise multi-layer IC patterning by checking alignment before exposure. This instrument falls under tariff item 9030.82.00 as it is used for measuring or checking semiconductor wafers.
Compound Semiconductor Wafer Analyzer
A multi-technique analyzer for compound semiconductor wafers such as GaAs, GaN, and SiC, measuring sheet resistance, carrier mobility, and Hall effect. It is essential for RF and power electronics production, providing critical electrical characterization. This instrument is classified under tariff item 9030.82.00 as it measures or checks semiconductor wafers.
IC Parametric Electrical Analyzer
A precision instrument that tests electrical parameters of individual transistors and ICs on wafers for process control monitoring, measuring leakage current, threshold voltage, and other characteristics. It is used during semiconductor fabrication to ensure device quality. This instrument falls under tariff item 9030.82.00 as it is specifically for measuring or checking semiconductor devices.
Integrated Circuit Tester Prober Station
An automated prober station that electrically tests individual ICs and devices on wafers for functionality before dicing. It includes probe cards and test head interfaces to ensure semiconductor devices meet specifications. This equipment is classified under tariff item 9030.82.00 as it is used for measuring or checking semiconductor devices.
LED Wafer Testing Microprobe Station
A microprobe station for electrically characterizing LED chips and microLED arrays on wafers before singulation, testing luminous efficacy, forward voltage, and other parameters. It is used in semiconductor manufacturing to ensure LED device quality. This instrument falls under tariff item 9030.82.00 as it measures or checks semiconductor devices, including optoelectronic devices.