Integrated Circuit Tester Prober Station from China
An automated prober station that electrically tests individual ICs and devices on wafers for functionality before dicing. It includes probe cards and test head interfaces to ensure semiconductor devices meet specifications. This equipment is classified under tariff item 9030.82.00 as it is used for measuring or checking semiconductor devices.
Duty Rate — China → Canada
0%
Import Tips
• Classify the prober station under 9030.82.00 and include probe cards if they are essential parts of the system
• Ensure the CBSA declaration lists all components to avoid delays
• Check if the equipment qualifies for the Manufacturing and Processing Machinery Remission if used in production