Wafer Particle Counter Scanner from Japan
A laser scattering system that scans wafers to count and size contamination particles that could cause IC defects, meeting strict cleanroom standards for semiconductor production. It is used for quality control in wafer fabrication. This equipment falls under tariff item 9030.82.00 as it measures or checks semiconductor wafers.
Duty Rate — Japan → Canada
0%
Import Tips
• Classify the scanner under 9030.82.00 and provide technical specifications showing its use for wafer checking
• If the scanner uses laser technology, ensure it complies with Canadian laser safety standards
• Verify if the equipment qualifies for the Scientific Research and Experimental Development (SR&ED) tax incentive if used for R&D