Scanning Electron Microscope (SEM)
A scanning electron microscope (SEM) uses a focused electron beam to scan a sample's surface, producing high-resolution images of topography and composition. As a non-optical microscope, it is classified under tariff item 9012.10.00.
Import Duty Rates by Country of Origin
| Origin Country | MFN Tariff | Surtaxes | Total Effective Rate |
|---|---|---|---|
| 🇨🇳China | Free | — | Free |
| 🇲🇽Mexico | Free | — | Free |
| 🇺🇸United States | Free | — | Free |
| 🇩🇪Germany | Free | — | Free |
| 🇯🇵Japan | Free | — | Free |
More Specific Codes
This product may fall under a more specific subheading:
Alternative Classifications
This product could be classified differently depending on its characteristics or intended use.
If the SEM is imported with a standalone EDS detector as a separate unit
Standalone X-ray detectors are classified under heading 9022.
Not sure which classification is right?
The Tariff Assistant works through the GRI rules on your specific product to reach the right tariff item — and can price the duty on it in the same conversation.
Import Tips & Compliance
• Declare the SEM as a non-optical microscope under 9012.10.00, and provide documentation on the electron beam technology
• If the SEM includes an energy-dispersive X-ray spectrometer (EDS), confirm whether it is integrated or separate; if separate, it may be classified under heading 9022
Related Products under Tariff item 9012.10.00
Atomic Force Microscope (AFM)
An atomic force microscope (AFM) uses a sharp probe to scan a sample surface, measuring interatomic forces to generate high-resolution 3D topographic images. It operates without optical magnification, relying on mechanical detection, and is therefore classified as a microscope other than an optical microscope under tariff item 9012.10.00.
Electron Probe Microanalyzer (EPMA)
An electron probe microanalyzer (EPMA) combines electron microscopy with wavelength-dispersive X-ray spectrometry to perform elemental analysis at microscopic scales. Its primary function is imaging via electron beams, making it a non-optical microscope under tariff item 9012.10.00.
Field Emission Microscope
A field emission microscope uses field-emitted electrons to image surface structures at high resolution under ultra-high vacuum conditions. As it relies on electron emission rather than light, it qualifies as a non-optical microscope under tariff item 9012.10.00.
Helium Ion Microscope
A helium ion microscope uses a focused beam of helium ions to image surfaces with sub-nanometer resolution, offering minimal sample damage. It is a charged-particle microscope, not an optical one, and is correctly classified under tariff item 9012.10.00.
Near-Field Scanning Optical Microscope (NSOM)
A near-field scanning optical microscope (NSOM) achieves resolution beyond the diffraction limit using a sub-wavelength aperture, but it still employs optical detection. Despite its optical nature, it is classified as a specialized non-optical microscope under tariff item 9012.10.00 due to its scanning probe mechanism.
Neutron Diffraction Instrument
A neutron diffraction instrument uses neutron beams to probe magnetic structures and atomic arrangements in materials, producing diffraction patterns. As a diffraction apparatus that does not rely on optical methods, it falls under tariff item 9012.10.00.