Microscopes other than optical microscopes; diffraction apparatus
Microscopes other than optical microscopes; diffraction apparatus. > Microscopes other than optical microscopes; diffraction apparatus > Microscopes other than optical microscopes; diffraction apparatus
Duty Rate (from China)
Products classified under Tariff item 9012.10
Atomic Force Microscope (AFM)
An atomic force microscope (AFM) uses a sharp probe to scan a sample surface, measuring interatomic forces to generate high-resolution 3D topographic images. It operates without optical magnification, relying on mechanical detection, and is therefore classified as a microscope other than an optical microscope under tariff item 9012.10.00.
9012.10.00Electron Probe Microanalyzer (EPMA)
An electron probe microanalyzer (EPMA) combines electron microscopy with wavelength-dispersive X-ray spectrometry to perform elemental analysis at microscopic scales. Its primary function is imaging via electron beams, making it a non-optical microscope under tariff item 9012.10.00.
9012.10.00Field Emission Microscope
A field emission microscope uses field-emitted electrons to image surface structures at high resolution under ultra-high vacuum conditions. As it relies on electron emission rather than light, it qualifies as a non-optical microscope under tariff item 9012.10.00.
9012.10.00Helium Ion Microscope
A helium ion microscope uses a focused beam of helium ions to image surfaces with sub-nanometer resolution, offering minimal sample damage. It is a charged-particle microscope, not an optical one, and is correctly classified under tariff item 9012.10.00.
9012.10.00Near-Field Scanning Optical Microscope (NSOM)
A near-field scanning optical microscope (NSOM) achieves resolution beyond the diffraction limit using a sub-wavelength aperture, but it still employs optical detection. Despite its optical nature, it is classified as a specialized non-optical microscope under tariff item 9012.10.00 due to its scanning probe mechanism.
9012.10.00Neutron Diffraction Instrument
A neutron diffraction instrument uses neutron beams to probe magnetic structures and atomic arrangements in materials, producing diffraction patterns. As a diffraction apparatus that does not rely on optical methods, it falls under tariff item 9012.10.00.
9012.10.00Powder X-Ray Diffractometer
A powder X-ray diffractometer analyzes polycrystalline samples by measuring diffraction angles of X-rays scattered from the sample. It is a dedicated diffraction apparatus, not an optical microscope, and is classified under tariff item 9012.10.00.
9012.10.00Scanning Electron Microscope (SEM)
A scanning electron microscope (SEM) uses a focused electron beam to scan a sample's surface, producing high-resolution images of topography and composition. As a non-optical microscope, it is classified under tariff item 9012.10.00.
9012.10.00Scanning Tunneling Microscope (STM)
A scanning tunneling microscope (STM) measures quantum tunneling currents between a sharp probe and a sample surface to produce atomic-scale images. It operates without light, using electron tunneling, and is classified as a non-optical microscope under tariff item 9012.10.00.
9012.10.00Transmission Electron Microscope (TEM)
A transmission electron microscope (TEM) transmits a beam of electrons through an ultra-thin specimen to form images at atomic resolution. As a non-optical microscope using electron transmission, it is classified under tariff item 9012.10.00.
9012.10.00X-Ray Diffraction Apparatus
X-ray diffraction apparatus directs X-rays at crystalline samples to analyze atomic and molecular structure through diffraction patterns. It is a diffraction apparatus, not an optical microscope, and is classified under tariff item 9012.10.00.