Electron Probe Microanalyzer (EPMA)
An electron probe microanalyzer (EPMA) combines electron microscopy with wavelength-dispersive X-ray spectrometry to perform elemental analysis at microscopic scales. Its primary function is imaging via electron beams, making it a non-optical microscope under tariff item 9012.10.00.
Import Duty Rates by Country of Origin
| Origin Country | MFN Tariff | Surtaxes | Total Effective Rate |
|---|---|---|---|
| 🇨🇳China | Free | — | Free |
| 🇲🇽Mexico | Free | — | Free |
| 🇺🇸United States | Free | — | Free |
| 🇩🇪Germany | Free | — | Free |
| 🇯🇵Japan | Free | — | Free |
More Specific Codes
This product may fall under a more specific subheading:
Alternative Classifications
This product could be classified differently depending on its characteristics or intended use.
If the EPMA is imported solely as an X-ray spectrometer without the electron microscope component
Standalone X-ray spectrometry equipment falls under heading 9022 for X-ray apparatus.
Not sure which classification is right?
The Tariff Assistant works through the GRI rules on your specific product to reach the right tariff item — and can price the duty on it in the same conversation.
Import Tips & Compliance
• Classify the EPMA as a non-optical microscope and include the X-ray spectrometer as an integral part; if the spectrometer is imported separately, it may be classified under heading 9022
• Provide a detailed description of the instrument's imaging and analysis functions to avoid misclassification
Related Products under Tariff item 9012.10.00
Atomic Force Microscope (AFM)
An atomic force microscope (AFM) uses a sharp probe to scan a sample surface, measuring interatomic forces to generate high-resolution 3D topographic images. It operates without optical magnification, relying on mechanical detection, and is therefore classified as a microscope other than an optical microscope under tariff item 9012.10.00.
Field Emission Microscope
A field emission microscope uses field-emitted electrons to image surface structures at high resolution under ultra-high vacuum conditions. As it relies on electron emission rather than light, it qualifies as a non-optical microscope under tariff item 9012.10.00.
Helium Ion Microscope
A helium ion microscope uses a focused beam of helium ions to image surfaces with sub-nanometer resolution, offering minimal sample damage. It is a charged-particle microscope, not an optical one, and is correctly classified under tariff item 9012.10.00.
Near-Field Scanning Optical Microscope (NSOM)
A near-field scanning optical microscope (NSOM) achieves resolution beyond the diffraction limit using a sub-wavelength aperture, but it still employs optical detection. Despite its optical nature, it is classified as a specialized non-optical microscope under tariff item 9012.10.00 due to its scanning probe mechanism.
Neutron Diffraction Instrument
A neutron diffraction instrument uses neutron beams to probe magnetic structures and atomic arrangements in materials, producing diffraction patterns. As a diffraction apparatus that does not rely on optical methods, it falls under tariff item 9012.10.00.
Powder X-Ray Diffractometer
A powder X-ray diffractometer analyzes polycrystalline samples by measuring diffraction angles of X-rays scattered from the sample. It is a dedicated diffraction apparatus, not an optical microscope, and is classified under tariff item 9012.10.00.