Electron Probe Microanalyzer (EPMA) from Mexico
An electron probe microanalyzer (EPMA) combines electron microscopy with wavelength-dispersive X-ray spectrometry to perform elemental analysis at microscopic scales. Its primary function is imaging via electron beams, making it a non-optical microscope under tariff item 9012.10.00.
Duty Rate — Mexico → Canada
PGA flags (1)Show detailsHide detailsHCRadiation Emitting DevicesMay be required
- HC
Radiation Emitting Devices · May be required
May require HC Radiation Emitting Devices depending on Canadian product category (HC40, HC41, HC42, HC43, HC44, HC45). Matching criteria: Equal To 9012100000. Logic: MATCH IF (Valid HS Code) AND (Valid Canadian Product Category).
CBSA Single Window matching criteria, unknown
Import Tips
• Classify the EPMA as a non-optical microscope and include the X-ray spectrometer as an integral part; if the spectrometer is imported separately, it may be classified under heading 9022
• Provide a detailed description of the instrument's imaging and analysis functions to avoid misclassification