Electron Probe Microanalyzer (EPMA) from Japan
An electron probe microanalyzer (EPMA) combines electron microscopy with wavelength-dispersive X-ray spectrometry to perform elemental analysis at microscopic scales. Its primary function is imaging via electron beams, making it a non-optical microscope under tariff item 9012.10.00.
Duty Rate — Japan → Canada
0%
Import Tips
• Classify the EPMA as a non-optical microscope and include the X-ray spectrometer as an integral part; if the spectrometer is imported separately, it may be classified under heading 9022
• Provide a detailed description of the instrument's imaging and analysis functions to avoid misclassification