Scanning Tunneling Microscope (STM)
A scanning tunneling microscope (STM) measures quantum tunneling currents between a sharp probe and a sample surface to produce atomic-scale images. It operates without light, using electron tunneling, and is classified as a non-optical microscope under tariff item 9012.10.00.
Import Duty Rates by Country of Origin
| Origin Country | MFN Tariff | Surtaxes | Total Effective Rate |
|---|---|---|---|
| 🇨🇳China | Free | — | Free |
| 🇲🇽Mexico | Free | — | Free |
| 🇺🇸United States | Free | — | Free |
| 🇩🇪Germany | Free | — | Free |
| 🇯🇵Japan | Free | — | Free |
More Specific Codes
This product may fall under a more specific subheading:
Alternative Classifications
This product could be classified differently depending on its characteristics or intended use.
If importing only the scanning probe head or other parts of the STM
Parts and accessories for non-optical microscopes are classified under tariff item 9012.90.00.
Not sure which classification is right?
The Tariff Assistant works through the GRI rules on your specific product to reach the right tariff item — and can price the duty on it in the same conversation.
Import Tips & Compliance
• Provide technical specifications showing the STM's tunneling current measurement to support classification under 9012.10.00
• If the STM includes vibration isolation systems, ensure they are declared as parts of the microscope
Related Products under Tariff item 9012.10.00
Atomic Force Microscope (AFM)
An atomic force microscope (AFM) uses a sharp probe to scan a sample surface, measuring interatomic forces to generate high-resolution 3D topographic images. It operates without optical magnification, relying on mechanical detection, and is therefore classified as a microscope other than an optical microscope under tariff item 9012.10.00.
Electron Probe Microanalyzer (EPMA)
An electron probe microanalyzer (EPMA) combines electron microscopy with wavelength-dispersive X-ray spectrometry to perform elemental analysis at microscopic scales. Its primary function is imaging via electron beams, making it a non-optical microscope under tariff item 9012.10.00.
Field Emission Microscope
A field emission microscope uses field-emitted electrons to image surface structures at high resolution under ultra-high vacuum conditions. As it relies on electron emission rather than light, it qualifies as a non-optical microscope under tariff item 9012.10.00.
Helium Ion Microscope
A helium ion microscope uses a focused beam of helium ions to image surfaces with sub-nanometer resolution, offering minimal sample damage. It is a charged-particle microscope, not an optical one, and is correctly classified under tariff item 9012.10.00.
Near-Field Scanning Optical Microscope (NSOM)
A near-field scanning optical microscope (NSOM) achieves resolution beyond the diffraction limit using a sub-wavelength aperture, but it still employs optical detection. Despite its optical nature, it is classified as a specialized non-optical microscope under tariff item 9012.10.00 due to its scanning probe mechanism.
Neutron Diffraction Instrument
A neutron diffraction instrument uses neutron beams to probe magnetic structures and atomic arrangements in materials, producing diffraction patterns. As a diffraction apparatus that does not rely on optical methods, it falls under tariff item 9012.10.00.