9012.10.00/Scanning Electron Microscope (SEM)/Japan

Scanning Electron Microscope (SEM) from Japan

A scanning electron microscope (SEM) uses a focused electron beam to scan a sample's surface, producing high-resolution images of topography and composition. As a non-optical microscope, it is classified under tariff item 9012.10.00.

Duty Rate — Japan → Canada

PGA flags (1)Show detailsHCRadiation Emitting DevicesMay be required

HC
Radiation Emitting Devices · May be required
May require HC Radiation Emitting Devices depending on Canadian product category (HC40, HC41, HC42, HC43, HC44, HC45). Matching criteria: Equal To 9012100000. Logic: MATCH IF (Valid HS Code) AND (Valid Canadian Product Category).

CBSA Single Window matching criteria, unknown

Calculate with your customs value Verify with the Tariff Assistant

Import Tips

• Declare the SEM as a non-optical microscope under 9012.10.00, and provide documentation on the electron beam technology

• If the SEM includes an energy-dispersive X-ray spectrometer (EDS), confirm whether it is integrated or separate; if separate, it may be classified under heading 9022