Scanning Electron Microscope (SEM) from Germany
A scanning electron microscope (SEM) uses a focused electron beam to scan a sample's surface, producing high-resolution images of topography and composition. As a non-optical microscope, it is classified under tariff item 9012.10.00.
Duty Rate — Germany → Canada
0%
Import Tips
• Declare the SEM as a non-optical microscope under 9012.10.00, and provide documentation on the electron beam technology
• If the SEM includes an energy-dispersive X-ray spectrometer (EDS), confirm whether it is integrated or separate; if separate, it may be classified under heading 9022