Other
Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: > Other optical instruments and appliances: > For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) > For inspecting semiconductor wafers or devices: > Other
Duty Rate (from China)
Except for products described in headings 9903.03.02–9903.03.11, articles the product of any country, as provided for in subdivision (aa) of U.S. note 2 to this subchapter
Except as provided in headings 9903.88.05, 9903.88.06, 9903.88.07, 9903.88.08, 9903.88.10, 9903.88.11, 9903.88.14, 9903.88.19, 9903.88.50, 9903.88.52, 9903.88.58, 9903.88.60, 9903.88.62, 9903.88.66, 9903.88.67, 9903.88.68, or 9903.88.69, articles the product of China, as provided for in U.S. note 20(a) to this subchapter and as provided for in the subheadings enumerated in U.S. note 20(b) [to this subchapter]
Products classified under HTS 9031.41.00.60
Nanotopography Wafer Mapper
High-resolution optical mapping system measuring wafer nanotopography for semiconductor yield optimization. Detects subtle surface variations affecting lithography focus. HTS 9031.41.0060 for other optical wafer inspection appliances.
Wafer Defect Inspection Scanner
An optical scanner designed to detect microscopic defects on semiconductor wafers during manufacturing. It uses laser-based imaging and AI analysis to identify particles, cracks, and pattern anomalies on silicon wafers. Classified under HTS 9031.41.0060 as an other optical instrument specifically for inspecting semiconductor wafers.
Automated Reticle Pattern Checker
Precision optical system for inspecting photomasks and reticles used in semiconductor lithography, detecting line width variations and contamination. Employs UV light and high-resolution cameras for pattern verification. Falls under HTS 9031.41.0060 for other wafer/device inspection instruments.
Laser-Based Wafer Surface Profiler
Non-contact optical profiler using interferometry to measure wafer surface topography and flatness for semiconductor processing. Detects nanometer-level variations critical for chip fabrication. HTS 9031.41.0060 covers this as other optical appliance for wafer inspection.
Darkfield Wafer Particle Counter
Optical darkfield microscope system for counting and sizing particles on unpatterned semiconductor wafers. Uses scattered light imaging to achieve high sensitivity for cleanroom quality control. Classified in HTS 9031.41.0060 as other semiconductor wafer inspection equipment.
UV Fluorescence Wafer Inspector
Specialized UV optical system detecting organic contaminants and subsurface defects on semiconductor wafers via fluorescence imaging. Essential for post-CMP process monitoring. HTS 9031.41.0060 for other optical wafer inspection appliances.
Critical Dimension SEM Wafer Metrology Tool
Optical pre-alignment system for scanning electron microscopes measuring critical dimensions on semiconductor device patterns. Provides optical overlay for nanoscale feature inspection. Under HTS 9031.41.0060 as other wafer/device optical inspector.
Phase Shift Mask Inspector
Advanced optical interferometer for inspecting phase shift photomasks used in semiconductor lithography, measuring phase uniformity and defects. Critical for 193nm immersion lithography processes. HTS 9031.41.0060 covers other wafer inspection optical tools.
Inline Wafer Overlay Metrology System
Real-time optical metrology tool measuring overlay accuracy between lithographic layers on production semiconductor wafers. Uses broadband illumination and image analysis. Classified HTS 9031.41.0060 for other semiconductor wafer optical inspection.
EUV Blank Inspection System
Extreme ultraviolet optical inspection system for EUV photomask blanks used in cutting-edge semiconductor manufacturing. Detects defects invisible to visible light inspection. Under HTS 9031.41.0060 as other semiconductor wafer inspection optical instrument.
Wafer Edge Inspection Profiler
Specialized optical profiler examining semiconductor wafer edges for chipping, cracks, and geometry critical for handling and lithography. Uses 360° imaging technology. HTS 9031.41.0060 covers other wafer optical inspection tools.
Multi-Wafer Cassette Optical Inspector
Non-contact optical system inspecting multiple semiconductor wafers in FOUP cassettes for particles and positioning without removal. Critical for fab logistics. Classified HTS 9031.41.0060 for other wafer inspection optics.
Post-Die Singulation Inspection Scanner
Optical scanner inspecting individual semiconductor dies after wafer dicing for edge quality and contamination. High-speed imaging for pick-and-place yield optimization. HTS 9031.41.0060 for other semiconductor device optical inspection.
3D NAND Wafer Structure Inspector
Specialized optical scatterometry system measuring 3D NAND flash memory structures on semiconductor wafers. Analyzes complex stacked layer dimensions. Under HTS 9031.41.0060 as other optical wafer inspection instrument.
Advanced Packaging Wafer Inspector
Optical inspection system for fan-out wafer-level packaging (FOWLP) semiconductor wafers, checking redistribution layers and underfill voids. Essential for heterogeneous integration. HTS 9031.41.0060 for other wafer optical inspection.