SiC MOSFET Test Wafer
A 4-inch silicon carbide test wafer with process control monitor (PCM) structures and unmounted MOSFET dice for automotive traction inverters. Classified under tariff item 8541.59.00 as a semiconductor device wafer, it is used for yield testing and process validation rather than final product assembly.
Import Duty Rates by Country of Origin
| Origin Country | MFN Tariff | Surtaxes | Total Effective Rate |
|---|---|---|---|
| 🇨🇳China | Free | — | Free |
| 🇲🇽Mexico | Free | — | Free |
| 🇺🇸United States | Free | — | Free |
| 🇩🇪Germany | Free | — | Free |
| 🇯🇵Japan | Free | — | Free |
Alternative Classifications
This product could be classified differently depending on its characteristics or intended use.
If the wafer contains only MOSFET transistors and is not used for testing
Wafers with transistor dice are classified under the transistor subheadings.
If the PCM structures are considered integrated circuits
Process control monitors with integrated circuit elements may fall under heading 85.42.
Not sure which classification is right?
The Tariff Assistant works through the GRI rules on your specific product to reach the right tariff item — and can price the duty on it in the same conversation.
Import Tips & Compliance
• Declare the wafer as a semiconductor device for testing purposes, not as waste or scrap
• Provide documentation explaining the PCM structures and their function to the CBSA
• Verify if the test wafer qualifies for duty-free treatment under a trade agreement with Canada
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