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SiC MOSFET Test Wafer from China

A 4-inch silicon carbide test wafer with process control monitor (PCM) structures and unmounted MOSFET dice for automotive traction inverters. Classified under tariff item 8541.59.00 as a semiconductor device wafer, it is used for yield testing and process validation rather than final product assembly.

Duty Rate — China → Canada

0%
PGA flags (1)Show detailsHCConsumer Products SafetyMay be required
  • HC

    Consumer Products Safety · May be required

    May require HC Consumer Products Safety depending on intended use (HC21) and Canadian product category (HC29, HC30, HC31, HC32, HC33, HC34, HC35, HC36, HC37); or intended use (HC22, HC23, HC24, HC26, HC27) and Canadian product category (HC37). Matching criteria: Equal To 8541590000; Equal To 8541590000. Logic: MATCH IF (Valid HS Code) AND (Intended Use Code) AND (Valid Canadian Product Category).

CBSA Single Window matching criteria, unknown

Import Tips

• Declare the wafer as a semiconductor device for testing purposes, not as waste or scrap

• Provide documentation explaining the PCM structures and their function to the CBSA

• Verify if the test wafer qualifies for duty-free treatment under a trade agreement with Canada

SiC MOSFET Test Wafer from China — Import Duty Rate | Tariff item 8541.59.00