SiC MOSFET Test Wafer from China
A 4-inch silicon carbide test wafer with process control monitor (PCM) structures and unmounted MOSFET dice for automotive traction inverters. Classified under tariff item 8541.59.00 as a semiconductor device wafer, it is used for yield testing and process validation rather than final product assembly.
Duty Rate — China → Canada
0%
Import Tips
• Declare the wafer as a semiconductor device for testing purposes, not as waste or scrap
• Provide documentation explaining the PCM structures and their function to the CBSA
• Verify if the test wafer qualifies for duty-free treatment under a trade agreement with Canada