Atomic Force Microscope Cantilever Array

Silicon nitride cantilever array for multi-mode AFM systems used in nanotechnology research. Repair components for 9810.00.60-admitted atomic force microscopes at university labs.

Import Duty Rates by Country of Origin

Origin CountryMFN RateCh.99 SurchargesTotal Effective Rate
🇨🇳ChinaFree+10.0%10%
🇲🇽MexicoFree+10.0%10%
🇨🇦CanadaFree+10.0%10%
🇩🇪GermanyFree+10.0%10%
🇯🇵JapanFree+10.0%10%

Alternative Classifications

This product could be classified differently depending on its characteristics or intended use.

8479.89Higher: 12.5% vs 10%

If classified as mechanical appliance

AFM probe components without instrument context classify under machinery

8113.00.00.00Higher: 38.7% vs 10%

If imported as bulk ceramic material

Base ceramic articles without specific instrument function

Not sure which classification is right?

Our AI classifier can analyze your specific product and recommend the correct HTS code with confidence.

Import Tips & Compliance

Document spring constant and tip radius specifications; verify institutional research use; maintain 5-year non-commercial use records

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