Atomic Force Microscope Cantilever Array from Japan
Silicon nitride cantilever array for multi-mode AFM systems used in nanotechnology research. Repair components for 9810.00.60-admitted atomic force microscopes at university labs.
Duty Rate — Japan → United States
12.5%
Rate breakdown
9903.05.4912.5%Except for products described in headings 9903.05.85–9903.05.92, articles the product of Japan, with an ad valorem (or ad valorem equivalent) rate of duty under column 1 less than 12.5 percent, as provided for in U.S. note 52 to this subchapter
Import Tips
• Document spring constant and tip radius specifications; verify institutional research use; maintain 5-year non-commercial use records